Correct Answer: Input
Explanation:
Note: This Question is unanswered, help us to find answer for this one
ISTQB Skill Assessment
Your Skill Level: Poor
Retake Quizzes to improve it
More ISTQB MCQ Questions
A statement of test objectives - and possibly test ideas about how to test. Test charters are used in exploratory testing. See also exploratory testing. An informal test design technique where the tester actively controls the design of the tests as t
The behavior predicted by the specification - or another source - of the component or system under specified conditions.
The process of identifying differences between the actual results produced by the component or system under test and the expected results for a test. Test comparison can be performed during test execution (dynamic comparison) or after test execution.
The capability of the software product to re-establish a specified level of performance and recover the data directly affected in case of failure. [ISO 9126] See also reliability. The ability of the software product to perform its required functions
A method to determine test suite thoroughness by measuring the extent to which a test suite can discriminate the program from slight variants (mutants) of the program.
Tests aimed at showing that a component or system does not work. Negative testing is related to the testers' attitude rather than a specific test approach or test design technique - e.g. testing with invalid input values or exceptions. [After Beizer]
The percentage of boundary values that have been exercised by a test suite.
A high level metric of effectiveness and/or efficiency used to guide and control progressive test development - e.g. Defect Detection Percentage (DDP).
Two persons - e.g. two testers - a developer and a tester - or an end-user and a tester - working together to find defects. Typically - they share one computer and trade control of it while testing.
The degree to which a component - system or process meets specified requirements and/or user/customer needs and expectations. [After IEEE 610]